What is the principle of X-ray fluorescence?

The principle of X-ray fluorescence is the emission of characteristic X-rays by atoms when excited by high-energy photons.

X-ray fluorescence (XRF) is a non-destructive analytical technique used to determine the elemental composition of materials. When a sample is exposed to high-energy photons, such as X-rays, the atoms in the sample become excited and emit characteristic X-rays. These X-rays have energies that are specific to the element from which they originated. By detecting and analysing these X-rays, the elemental composition of the sample can be determined.

The intensity of the emitted X-rays is proportional to the concentration of the element in the sample. Therefore, XRF can be used for both qualitative and quantitative analysis. Qualitative analysis involves identifying the elements present in a sample, while quantitative analysis involves determining the concentration of each element.

XRF is widely used in a variety of fields, including geology, archaeology, environmental science, and materials science. It is particularly useful for analysing metals, minerals, and ceramics. XRF instruments are portable and easy to use, making them ideal for fieldwork and on-site analysis.

In conclusion, X-ray fluorescence is a powerful analytical technique that allows for the non-destructive determination of the elemental composition of materials. Its versatility and ease of use make it a valuable tool for a wide range of applications.